TY - CONF T1 - An Overseer Control Methodology for Data Adaptable Embedded Systems T2 - International Workshop on Multi-Paradigm Modeling (MPM) Y1 - 2012 A1 - Sean Whitsitt A1 - Jonathan Sprinkle A1 - Roman Lysecky JF - International Workshop on Multi-Paradigm Modeling (MPM) UR - http://dx.doi.org/10.1145/2508443.2508448 ER -